Please use this identifier to cite or link to this item:
http://rdcb.cbg.ipn.mx/handle/20.500.12273/438| Title: | Effects of low-temperature annealing on electrical properties of thin-film transistors based on zinc oxide films deposited by ultrasonic spray pyrolysis: impact of annealing time |
| Author: | ABDU ORDUÑA DIAZ |
| Author ID: | info:eu-repo/dai/mx/cvu/171850 |
| Issue Date: | 11-Jul-2016 |
| Publisher: | Elsevier |
| License: | http://creativecommons.org/licenses/by-nc/4.0 |
| URI: | http://rdcb.cbg.ipn.mx/handle/20.500.12273/438 |
| Language: | eng |
| Appears in Collections: | Artículos Científicos |
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