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Please use this identifier to cite or link to this item: http://rdcb.cbg.ipn.mx/handle/20.500.12273/438
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dc.rights.licensehttp://creativecommons.org/licenses/by-nc/4.0es_MX
dc.creatorABDU ORDUÑA DIAZes_MX
dc.date.accessioned2018-07-26T04:08:01Z-
dc.date.available2018-07-26T04:08:01Z-
dc.date.issued2016-07-11-
dc.identifier.urihttp://rdcb.cbg.ipn.mx/handle/20.500.12273/438-
dc.language.isoenges_MX
dc.publisherElsevier-
dc.rightsinfo:eu-repo/semantics/openAccesses_MX
dc.sourceThin Solid Films. Vol. 615 (30). Sep 2016.-
dc.titleEffects of low-temperature annealing on electrical properties of thin-film transistors based on zinc oxide films deposited by ultrasonic spray pyrolysis: impact of annealing timees_MX
dc.typeinfo:eu-repo/semantics/articlees_MX
dc.creator.idinfo:eu-repo/dai/mx/cvu/171850es_MX
dc.subject.ctiinfo:eu-repo/classification/cti/2es_MX
dc.type.versioninfo:eu-repo/semantics/publishedVersiones_MX
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