Effects of low-temperature annealing on electrical properties of thin-film transistors based on zinc oxide films deposited by ultrasonic spray pyrolysis: impact of annealing time

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Campo DC	Valor	Lengua/Idioma
dc.rights.license	http://creativecommons.org/licenses/by-nc/4.0	es_MX
dc.creator	ABDU ORDUÑA DIAZ	es_MX
dc.date.accessioned	2018-07-26T04:08:01Z	-
dc.date.available	2018-07-26T04:08:01Z	-
dc.date.issued	2016-07-11	-
dc.identifier.uri	http://rdcb.cbg.ipn.mx/handle/20.500.12273/438	-
dc.language.iso	eng	es_MX
dc.publisher	Elsevier	-
dc.rights	info:eu-repo/semantics/openAccess	es_MX
dc.source	Thin Solid Films. Vol. 615 (30). Sep 2016.	-
dc.title	Effects of low-temperature annealing on electrical properties of thin-film transistors based on zinc oxide films deposited by ultrasonic spray pyrolysis: impact of annealing time	es_MX
dc.type	info:eu-repo/semantics/article	es_MX
dc.creator.id	info:eu-repo/dai/mx/cvu/171850	es_MX
dc.subject.cti	info:eu-repo/classification/cti/2	es_MX
dc.type.version	info:eu-repo/semantics/publishedVersion	es_MX
Aparece en las colecciones:	Artículos Científicos

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